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Machine, Tools & Components
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Suppliers Directory
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MEERA UDYOG
| Address : |
S-6 INDL AREA SITE A AGRA DELHI BYEPASS |
Telephone : |
565-403408 |
Fax : |
565-460257 |
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On-Line Trade Inquiry |
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Products |
METALLOGRAPHIC IMAGE ANALYSIS SYSTEMS - (MEERA-METZER M3.ACE) VERSATILE IMAGING SYSTEM FOR METALLOGRAPHY, THE IS WELL EQUIPPED FOR METALLURGIST, INDUSTRIAL APPLICATIONS AND R&D SOLUTIONS, FOR QUALITY CONTROL ANALYSIS AND DEVELOPMENT THE SYSTEM APART FROM IMAGING SOFTWARE AND REQUIRED HARDWARE CONSISTS OF VERSATILE NEW METZER INVO RANGE OF INVERTED METALLURGICAL MICROSCOPES. THESE MICROSCOPES, WITH T-SHAPED DESIGN, PRESENT A HIGHLY VERSATILE AND ERGONOMIC WAY FOR METALLGRAPHY AND MICROSTRUTURE EXAMINATION. INCORPORATED WITH HIGH PRECISION, WORLD CLASS OPTICS, MAGNIFICATION FROM 25X TO AS HIGH A 1500X IS POSSIBLE BRINGING FORTH CRISP AND CLEAR IMAGES. METALLOGRAPHIC OPERATIONS ARE DONE QUICKLY BY AUTOMATED PROCEDURES IN THE SOFTWARE INSELF. DETAILED REPORTS OF THE ANALYSIS CAN BE OBTAINED AND PRINTED WITH IMAGES, HISTOGRAMS, TABLES, DATA, TEXT AND RELATED COLOURED DISPLAYS ALONG WITH IDENTIFICATION INFORMATION LIKE JOB NO, COMPANY AND USER INFO, ETC.
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PCB INSPECTION STATIONS - PCB INSPECTION STATIONS FOR PCBS AND OTHER ELECTRONIC & ELECTRICAL ASSEMBLIES DETECT FLAWS CRACKS AND BREAKAGES THESE STATIONS INCORPORATE LOW MAGNIFICATION OF MAGNIFIERS AND HIGH ZOOM MAGNIFICATION OF MICROSCOPES ELIMINATING EYESTRAINS INVOLVED IN BOTH BEING CAMERA-BASED NON CONTACT INSPECTION SYSTEMS THESE PROJECT HIGH CONTRAST BRIGHTER AND SHARPER IMAGES ON A MONITOR EASILY VISIBLE THE SYSTEMS CAN BE INTERFACED TO PC FOR IMAGE CAPTURE AND ANALYSIS FOR REPORT PRINTING WITH IMAGES AND DATA THE PCB INSPECTION SYSTEMS ARE IDEAL CHOICE FOR ALL PCB AND ELECTRONIC INDUSTRIES
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PCB INSPECTION STATION - A COMPACT ERGONOMIC INSPECTION STATION FOR PCBS AND OTHER ELECTRONIC AND ELECTRICAL ASSEMBLIES, TO DETECT FLAWS, CRACKS, BREAKAGE IS WHAT MEERA UDYOG (INSTRUMENTS DIVISION) HAS LAUNCHED. ITS CALLED THE MEERA-METZER PCB INSPECTOR. THESE SYSTEMS INCORPORATE THE LOW MAGNIFICATION OF A MAGNIFIER AND HIGH ZOOM MAGNIFICATION OF A MICROSCOPE, DECLINING TO CONSIDER THE EYESTRAIN INVOLVED IN BOTH. BEING CAMERA BASED, NON-CONTACT INSPECTION SYSTEM, THEY PROJECT HIGH CONTRAST, BRIGHTER SHARPER IMAGES ON A MONITOR, EASILY VISIBLE TO MORE THAN ONE PERSON. INTENSITY CONTROLLED SURFACE ILLUMINATION VIA INCIDENT OR RING LIGHT ENSURES EVENLY LIGHTED IMAGES OF THE ASSEMBLIES. MAGNIFICATIONS ARE AVAILABLE IN VARIETY OF CHOICES VARYING FROM 7X TO 200X WITH ZOOM FACILITIES VIA HIGH QUALITY OPTICS. THE AVAILABILITY OF GLIDING STAGE AREA ENABLES EASY POSITIONING OF LARGE PCBS AND QUICKER INSPECTION. MEASURING OPTIONS CAN BE INCORPORATED WITH THE HELP OF HIGH PRECISION FLOATING TYPE WORK STAGES; DRO SYSTEMS, DATA PROCESSORS AND WINDOWS 95/98 BASED SOFTWARE OPTIONS. THE SYSTEM CAN ALSO BE INTERFACED TO PC FOR IMAGE CAPTURE AND ANALYSIS FOR REPORT PRINTING WITH IMAGES AND DATA.
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PRECISION MEASURING MICROSCOPE - THESE HIGH MAGNIFICATION MICROSCOPES HAVE SPECIAL THREE-PORT TRINOCULAR BODY FOR BINOCULAR VIEWING, VIDEO OUTPUT AND IMAGES OF PHOTOMICROGRAPHY. IMAGE ANALYSIS CAN BE DONE ON PC WITH CALIPER FUNCTIONS SUCH AS LENGTH, WIDTH, PERIMETER, RADIUS ANGLE AND OTHER OPERATIONS. TECHNICAL SPECIFICATIONS: MAGNIFICATION: 500X TO 10000X ON MONITOR OPTICAL SYSTEM: HIGH RESOLUTION OPTICS FOR SHARP IMAGES EYEPIECES: HY 5X AND WF 10X OBJECTIVES: 5X, 10X, 20X, 45X, 100X VIDEO CAMERA: HIGH-RESOLUTION CCD CAMERA B/W OR COLOUR, 470 LINES VIDEO MONITOR: HIGH RESOLUTION B/W OR COLOUR MEASURING OPTIONS: VERY HIGH PRECISION MEASURING STAGES WITH TRAVEL 25MM X 25 MM, 50MM X 50 MM UP TO 150MM X 150MM LEAST COUNT 1 MICRON FEATURES: CROSS LINE REFERENCE ON THE MONITOR SCREEN. TRANSMITTED DIA ILLUMINATION AND REFLECTED EPI ILLUMINATION WITH HIGH INTENSITY HALOGEN BULBS AND INTENSITY CONTROLS. OPTIONAL THICKNESS/DEPTH MEASUREMENT WITH LEAST COUNT OF 1 MICRON. OPTIONS AVAILABLE WITH DRO SYSTEMS, DATA PROCESSORS AND 2-D GEOMETRIC SOFTWARE VERSIONS WITH PC-INTERFACE.
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